In-situ piezoresponse force microscopy cantilever mode shape profiling

Vector piezoresponse force microscopy.

A novel approach for nanoscale imaging and characterization of the orientation dependence of electromechanical properties-vector piezoresponse force microscopy (Vector PFM)-is described. The relationship between local electromechanical response, polarization, piezoelectric constants, and crystallographic orientation is analyzed in detail. The image formation mechanism in vector PFM is discussed...

Electrostatic-free piezoresponse force microscopy

Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic effect often hinders accurate measurements. Thus, it is very important to quantify as well as remove...

Piezoresponse force microscopy and recent

Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in BiFeO3 nanostructures

imaging of ferroelectric domains in BiFeO3 nanostructures Ramesh Nath, Seungbum Hong, Jeffrey A. Klug, Alexandra Imre, Michael J. Bedzyk, Ram S. Katiyar, and Orlando Auciello Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, USA Institute of Functional Nanomaterials, University of Puerto Rico, San Juan Puerto Rico 00931, USA Department of Physics and Astronomy, No...

Contrast mechanism maps for piezoresponse force microscopy

Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation and local modification of ferroelectric domain structures on the submicron level. Both electrostatic and electromechanical interactions contribute at the tip-surface junction in a complex manner, which has resulted in multiple controversies in the interpretation of PFM. Here we analyze the influen...